The extreme thinness of the gate isolation layer means that high gate-source voltages will cause an internal flashover, even though the material itself has a high breakdown voltage rating. A GaN E-HEMT has a typical full enhancement voltage of 7V but will be damaged if the VGS exceeds ±1OV, much lower than the gate voltages that are typically used in
IGBT or SiC gate drivers. Due to the extremely fast rise and fall times of the low-capacitance gate channel, any excessive inductance in the external gate drive could cause spikes or voltage ringing and exceed these voltage limits. Therefore a 6V gate drive voltage is a good compromise between high efficiency and staying within a safe operating area.
IGBT or SiC gate drive circuits also typically turn off with a negative gate drive voltage. This speeds up the charge extraction from the gate capacitance and therefore the switch-off time. GaN Transistors have such low gate capacitance that a negative gate drive is not necessary. A gate voltage of OV will completely and reliably turn off the HEMT in nanoseconds. Only if the layout has excessive inductance would a negative gate drive offer protection against unintentional turn-an caused by ringing. However, as HEMT do not have a body diode like a MOSFETs and are symmetrically conductive devices, a negative gate voltage will increase reverse conduction lasses. A single ended 6V-OV gate drive voltage is ideal.
Figure 2 shows typical gate driver voltages that are commonly used. The 1st Generation
SiC MOSFETS use
+20/-5V supplies, but 2nd Generation devices will most likely use +15/-3V supply voltages:
Fig. 2: Typical Gate Driver supply voltages for IGBT, SiC and GaN drivers